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User contributions for Oluschinski

A user with 1,854 edits. Account created on 4 July 2025.
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2 December 2025

1 December 2025

  • 12:2912:29, 1 December 2025 diff hist −3 Error Limit No edit summary
  • 12:2812:28, 1 December 2025 diff hist +1,469 N Error Limit Created page with "{{Language_sel|LANG=ger|ARTIKEL=Fehlergrenze}} {{PSM_Infobox}} <span style="font-size:1.2em;font-weight:bold;">A-Bild-Technik</span> __FORCETOC__ ==Explanation of terms== In measurement or testing technology, error limits or limit deviations [1] are agreed or guaranteed maximum values for positive or negative deviations of the measured value display (output) of a measuring device from the correct value [2] (see also: measured value). Error limits mus..."
  • 12:2812:28, 1 December 2025 diff hist +2,817 N Errors Created page with "{{Language_sel|LANG=ger|ARTIKEL=Fehler}} {{PSM_Infobox}} <span style="font-size:1.2em;font-weight:bold;">Product errors</span> __FORCETOC__ ==Product defects== An essential legal basis for materials testing is the Product Liability Act (Produkthaftungsgesetz, Gesetz über die Haftung für fehlerhafte Produkte – ProdHaftG) of 15 December 1989 (Federal Law Gazette/p. 2198). Section 3 of this Act defines the term ‘defect’ as follows: A produc..."
  • 12:2712:27, 1 December 2025 diff hist 0 N File:Esem in-situ.jpg No edit summary current
  • 12:2712:27, 1 December 2025 diff hist 0 N File:Esem gummi.jpg No edit summary current
  • 12:2712:27, 1 December 2025 diff hist 0 N File:Esem bildentstehung.jpg No edit summary current
  • 12:2712:27, 1 December 2025 diff hist 0 N File:Esem.jpg No edit summary current
  • 12:2512:25, 1 December 2025 diff hist +6,630 N Environmental-SEM (ESEM) Created page with "{{Language_sel|LANG=ger|ARTIKEL=Umgebungs-REM}} {{PSM_Infobox}} <span style="font-size:1.2em;font-weight:bold;">Environmental-SEM (ESEM) (Author: Dr. Armin Zankel)</span> __FORCETOC__ ==General information== The method described here has different names in both German-language and English-language literature, which is partly due to different manufacturers. The characteristic feature of this scanning electron microscope method (SEM) ('''Fig. 1''') is the significantly l..."
  • 12:2512:25, 1 December 2025 diff hist +4,617 N Energy Elasticity Created page with "{{Language_sel|LANG=ger|ARTIKEL=Energieelastizität}} {{PSM_Infobox}} <span style="font-size:1.2em;font-weight:bold;">Energy elasticity</span> __FORCETOC__ ==Structural causes of energy elasticity== The structural cause of energy-elastic behaviour is the change in the average atomic distances and bond angles when mechanical stresses are applied. The mechanical work required to do this is stored in the form of potential energy (increase in internal energy) an..."
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