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Laser Extensometry

From Encyclopedia of plastics testing
Revision as of 12:42, 3 December 2025 by Oluschinski (talk | contribs) (Created page with "{{Language_sel|LANG=ger|ARTIKEL=Laserextensometrie}} {{PSM_Infobox}} <span style="font-size:1.2em;font-weight:bold;">Laser extensometry</span> __FORCETOC__ ==Recording of local strain== The deformation and fracture behaviour of plastics in the tensile test is significantly influenced not only by the test conditions but also by the internal condition of the material during manu...")
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Laser extensometry


Recording of local strain

The deformation and fracture behaviour of plastics in the tensile test is significantly influenced not only by the test conditions but also by the internal condition of the material during manufacture. The structure and morphology parameters (see: microscopic structure) of the tested specimens therefore determine not only the temporal and local deformation process, but also the area and type of upstream damage behaviour (see: micro-damage limits). The deformation process of heterogeneous and anisotropically structured plastics is basically always associated with a localization of the externally homogeneous deformation. A spatially resolved strain measurement technique such as laser extensometry is therefore required to understand these processes. Laser extensometry generally refers to scanning measurement techniques that are based on the transmission or reflection principle and use the test specimen as a radiation obstacle or reflector.

The deformation measurement is based on the determination of time, which refers to the scanning speed of a rotating mirror or prism. To record the local strain (see: laser heterogeneity of strain distribution), the test specimens must be provided with measuring marks or reflectors. The marks can be applied as a foil mask using a screen or pad printing process, or by simple light-dark contrasting using a spray or brush.

Laser extensometry – Device systems

To determine the local deformation behaviour, the following device systems are explained in detail in the Wiki-lexicon: “Polymer Testing & Diagnostics”:

References