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{{Language_sel|LANG=ger|ARTIKEL=Elektronenmikroskopie}}
{{PSM_Infobox}}
Electron microscopy (EM) (Author: [[Michler, Goerg Hannes|Prof. Dr. Goerg Hannes Michler]]) 
__FORCETOC__

==Introduction==

The diverse structures and [[Microscopic Structure|morphology]] of [[Plastics|plastics]] have been studied using electron microscopy for several decades. With the development of microscopic techniques and methods, structural details ranging from macroscopic sizes down to approximately 0.1 nm (= 10-10 m) can be imaged ('''Table 1'''). Alternative techniques are scattering methods (SALS – Small Angle Light Scattering; SAXS, WAXS – Small and Wide Angle X-ray Scattering; SANS – Small Angle Neutron Scattering), as scattering methods and microscopic techniques often provide complementary results.

'''Table 1:''' Size of structural details of plastics, [[Resolution Microscope|resolutions]] and magnifications that can be obtained with the various microscopic techniques and scattering methods

[[File:Elektronenmikroskopie1.jpg|600px]]

==Overview of methods==

Electron microscopy (EM) can be divided into the techniques of [[Transmission Electron Microscopy|transmission electron microscopy]] (TEM) and [[Scanning Electron Microscopy (SEM)|scanning electron microscopy (SEM)]]. A leap forward in the investigation of nanostructures (see also: [[Micromechanics & Nanomechanics|micromechanics & nanomechanics]]) in particular came with the development of scanning probe microscopy and, in particular, atomic force microscopy (AFM), a method that is important for plastics. The different types of microscopy can be classified in general terms according to whether an image is obtained by irradiation, as with a ‘lamp’, or by scanning the [[Surface|surface]] (see: [[Fracture Surface|fracture surface]]) as with a “finger” or a “needle” – see '''Fig. 1''' [1–3]:

[[File:em1.jpg]]
{|
|- valign="top"
|width="50px"|'''Fig. 1''':
|width="600px" |Schematic diagram of the principles of the different types of microscopy (see text) [1–3]
|}

'''Type 1 – Transmission''': A beam of [[Transmission Light|light]] or electrons passes through a thin sample or [[Test Piece|test piece]] in a light microscope (LM) or [[Transmission Electron Microscopy|transmission electron microscope]] (TEM); thin (LM) or ultra-thin samples (TEM) are required

'''Type 2 – Reflection''': A stationary beam is reflected by the sample; compact samples can be examined

'''Type 3 – Scanning beam''': A focused beam (laser light or electron beam) is scanned across the sample and reflected (in confocal laser scanning microscopy) or generates secondary and backscattered electrons (in scanning electron microscopy)

'''Type 4 – A focused scanning beam''' penetrates a thin sample (scanning transmission electron microscope)

'''Type 5 – Scanning tip''': A mechanical tip is scanned over the sample and interacts with it due to various physical properties (in [[Atomic Force Microscopy|atomic force microscopy]] or scanning tunnelling microscopy for conductive samples).

The various techniques can be used to examine the [[Surface|surfaces]] of compact plastics and their interiors – see diagram in '''Fig. 2''' above. Surface structures can be examined directly using [[Scanning Electron Microscopy|scanning electron microscopy]] (SEM, ESEM), [[Atomic Force Microscopy|atomic force microscopy]] (AFM) and indirectly using the imprint technique with [[Transmission Electron Microscopy|transmission electron microscopy]] (TEM). Ultra-thin and semi-thin sections of the interior are examined using TEM, and thicker sections using AFM. To compare the results that can be achieved with the various techniques, the figure below shows the typical cross-hatched morphology of commercial isotactic polypropylene ([[Plastics – Symbols and Abbreviated Terms|abbreviation]]: iPP) in individual images.

Numerous reviews cover the details of light microscopy [4, 5], electron microscopy [1, 6–11, 14] and [[Atomic Force Microscopy|atomic force microscopy]] [1, 3, 12, 13].

[[File:em2.jpg]]
{|
|- valign="top"
|width="50px"|'''Fig. 2''':
|width="600px" |'''oben:''' Use of various microscopic techniques to examine [[Fracture Surface|surfaces]] and the interior '''below:''' Comparison of the results of various microscopic techniques for α-iPP: a) SEM image after permanganate etching b) TEM image after chemical contrasting c) AFM image
|}

'''Acknowledgements'''

The editors of the lexicon would like to thank Prof. Dr. rer. nat. habil. [[Michler, Goerg Hannes|Goerg Hannes Michler]], [https://www.uni-halle.de Martin Luther University Halle-Wittenberg] and [[Polymer Service GmbH Merseburg]] for their guest contribution.

==See also==

* [[Scanning Electron Microscopy (SEM)|Scanning electron microscopy (SEM)]]
* [[Atomic Force Microscopy (AFM)|Atomic force microscopy (AFM)]]
* [[Environmental-SEM (ESEM)]]
* [[Transmission Electron Microscopy|Transmission electron microscopy]]
* [[In-situ Tensile Test in ESEM with AE|In-situ tensile test in ESEM with AE]]
* [[Microtomy]]

==References==

{|
|-valign="top"
|[1]
|[[Michler, Goerg Hannes|Michler, G. H.]]: Electron Microscopy of Polymers. Springer, Berlin Heidelberg (2008) (ISBN 978-3-54036350-7; see [[AMK-Library]] under F 1)
|-valign="top"
|[2]
|Michler, G. H., Balta-Calleja, F. J.: Nano- and Micromechanics of Polymers: Structure Modification and Improvement of Properties. Carl Hanser, Munich (2012) (ISBN 978-3-446-42767-9; see [[AMK-Library]] under F 13)
|-valign="top"
|[3]
|Michler, G. H.: Atlas of Polymer Morphology. Morphology, Deformation and Fracture Structures. Carl Hanser, Munich (2016) (ISBN 978-1-56990-557-9; E-Book ISBN 978-1-56990-558-6; see [[AMK-Library]] under F 14)
|-valign="top"
|[4]
|Kern, M., Trempler, J.: Observation and Measurement Microscopy in Material Science. Brünne-Verlag, Berlin Heidelberg (2008) (ISBN 978-3-9809-8489-8)
|-valign="top"
|[5]
|Wu, J., Chan, Ch.-M., Mai, Y.-W.: in Polymer Blends and Alloys; Shonaike, G. O.; Simon, G. P. (Eds.) Chapter 18, pp. 505 – 548
|-valign="top"
|[6]
|Michler, G. H., Lebek, W.: Ultramikrotomie in der Materialforschung. Carl Hanser, Munich (2004) (ISBN 3-446-22721-0; see [[AMK-Library]] under F 5)
|-valign="top"
|[7]
|Michler, G. H.: New possibilities of electron microscopical determination of the morphology polymers. Ultramicroscopy 15 (1984) 81–100
|-valign="top"
|[8]
|[https://de.wikipedia.org/wiki/Heinz_Bethge Bethge, H.], [https://de.wikipedia.org/wiki/Johannes_Heydenreich Heydenreich, J.]: (Eds.) Electron Microscopy in Solid State Physics. Elsevier Sci. Publ. Amsterdam (1987)
|-valign="top"
|[9]
|Goodhew, P. J., Humphreys, F. J., Beanland, R.: Electron Microscopy and Analysis. 3rd Edition., Taylor & Francis, London (2000) (ISBN 0-7484-0968-8)
|-valign="top"
|[10]
|Zhang, X.-F., Zhang, Z.: (Eds.) Progress in Transmission Electron Microscopy. 1: Concepts and Techniques. Springer, Berlin (2001) (ISBN 3-540-67680-5)
|-valign="top"
|[11]
|Li, Zh. R.: (Ed.) Industrial Application of Electron Microscopy. Marcel Dekker Inc., New York (2003)
|-valign="top"
|[12]
|Magonov, S. N.: In: Meyers, R. A. (Ed.) Encyclopedia of Analytical Chemistry. Wiley, Chichester, UK (2000) (ISBN 978-0-4719-7670-7)
|-valign="top"
|[13]
|Schönherr, H., Vancso, G. J.: Scanning Force Microscopy of Polymers. Springer, Berlin Heidelberg (2010) (ISBN 978-3-642-01231-0)
|-valign="top"
|[14]
|Michler, G. H.: Elektronenmikroskopie in Halle (Saale) – Stand, Perspektiven, Anwendungen. [[https://bethge-stiftung.de/ Heinz-Bethge-Stiftung für angewandte Elektronenmikroskopie]] (2017) (see [[AMK-Library]] under F 20)
|}

'''Additional references'''

* Picht, J., Heydenreich, I.: Einführung in die Elektronenmikroskopie. Verlag Technik (1966) (see [[AMK-Library]] under F 32)

[[Category:Morphology and Micromechanics]]
[[Category:Guest Contributions]]

Electron Microscopy - Revision history